Solar, Think Tank, Exclusive Articles — 24 August, 2025
UV-induced degradation of n-TOPCon and other PV cell technologies
As n-type tunnel oxide passivated contact (n-TOPCon) photovoltaic (PV) cell technologies gain widespread adoption due to their high initial efficiencies, a critical reliability concern is emerging: ultraviolet (UV)-induced degradation (UVID). This article offers a clear assessment of UVID, its impac...
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