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PVE300 – Photovoltaic Characterisation System


The PVE300 system has been developed in response to a growing demand for an integrated solution for PV device and material characterization. It provides direct determination of device spectral response (SR, A W-1), external quantum efficiency (EQE/IPCE, %) as well as internal quantum efficiency (IQE, %).

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The system comprises a light-tight measurement chamber, chopped monochromatic probe, dual-source input, one or two variable intensity bias sources, lock-in detection electronics and temperature-controlled vacuum mount. This can be used with substrate, superstrate and packaged devices.

The PVE300 is modular in nature and can be configured to cover the spectral range (from 250-2500nm) and device type of your choice. The system is available globally via Bentham Instruments UK, or through their specialist worldwide distributors.

Contact:

Bentham Instruments Ltd www.bentham.co.uk

 

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